TOF-SIMS mass spectrometry imaging, from biology and natural substances to old masters paintings.

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a widely used analytical technique for the study of surfaces in materials science. The development of polyatomic ion sources has allowed the analysis of organic compounds at a scale of less than one micron. Recently massive argon cluster ion sources allow a 3D analysis of samples. TOF-SIMS has thus become a method of choice for chemical imaging by mass spectrometry at the micrometric or sub-micrometric scale, complementary to matrix-assisted laser desorption ionization (MALDI), which is more widespread but limited to several microns. In addition to many applications where accurate lipid localization is proving to be a valuable tool in biological and biomedical fields, TOF-SIMS is also particularly useful for in situ analysis of metabolites in plant samples, or for accurate determination of the organic and mineral compositions of cultural heritage samples, such as old paintings.

This seminar will take place on Thursday 10 January, 3-4pm in B34 Boots Science Building, University Park Campus.

All are welcome, and no booking is required.